Team Awarded $1 M for Electron Microscope
A multidisciplinary team of researchers has won a large Department of Defense University Research Instrumentation Program (DURIP) award totaling $700,000 that will fund acquisition of a dual beam focused ion beam/scanning electron microscope (FIB/SEM). The specialized microscope will be equipped with a field-emission SEM column, a high-resolution gallium-ion FIB column, an array of different electron […]